波長范圍
(nm)
光譜分辨率
(nm)
焦距
(mm)
型號
掃描
陣列探測器
成像
真空
超高真空
光學設計
30 ～ 550
0.1
200
234/302
Available
Available
Available
Available
修正的凹面全息的
105 ～ 78,000
0.06
300
218
Available
Available
Available
Available
Criss Cross Czerny Turner
140 ～ 78,000
0.06
300
218D
Available
Available
Available
Double Criss Cross Czerny Turner
105 ～ 78,000
0.04
500
219
Available
Available
Available
Available
Available
Corrected Czerny Turner
30 ～ 1,200
0.05
500
235
Available
Available
Available
Available
Seya Namioka
105 ～ 78,000
0.03
670
207V
Available
Available
Available
Available
Available
Czerny Turner
105 ～ 78,000
0.017
1,000
2061V
Available
Available
Available
Available
Available
Czerny Turner
30 ～ 1,200
0.015
1,000
225
Available
Available
Available
Available
Available
Autofocus Normal Incidence
30 ～ 1,200
0.025
1,000
231
Available
Available
Available
Available
Available
Seya Namioka
105 ～ 78,000
0.012
1,330
209V
Available
Available
Available
Available
Available
Czerny Turner
30 ～ 1,200
0.007
2,000
2252
Available
Available
Available
Available
Available as Standard or Option
Autofocus Normal Incidence
30 ～ 1,200
0.005
3,000
2253
Available
Available
Available
Available
Available as Standard or Option
Autofocus Normal Incidence
30 ～ 1,200
< 0.005
3,000
241
Available
Available
Available
Available
Available as Standard or Option
Eagle Normal Incidence
30 ～ 1,200
< 0.003
5,000
2255
Available
Available
Available
Available
Available as Standard or Option
Autofocus Normal Incidence
30 ～ 1,200
< 0.0025
6,650
265S
Available
Available
Available
Available
Available as Standard or Option
Eagle Normal Incidence |
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|
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